CUED Publications database

Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits

Johnson, CM and Palmer, PR (1990) Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits. In: 4th International Conference on Power Electronics and Variable-Speed Drives, 1990-7-17 to 1990-7-19, London, UK pp. 417-423..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:14
Last Modified: 31 Jul 2015 02:19
DOI: