CUED Publications database

Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits

Johnson, CM and Palmer, PR (1990) Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits. In: 4th International Conference on Power Electronics and Variable-Speed Drives, 1990-7-17 to 1990-7-19, London, UK pp. 417-423..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:27
Last Modified: 25 Aug 2016 04:26
DOI: