CUED Publications database

Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits

Johnson, CM and Palmer, PR (1990) Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits. In: 4th International Conference on Power Electronics and Variable-Speed Drives, 17-7-1990 to 19-7-1990, London, UK pp. 417-423..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Event type = conference
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 28 Oct 2011 16:37
Last Modified: 30 Jan 2012 01:08
DOI:

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