CUED Publications database

Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits

Johnson, CM and Palmer, PR (1990) Improving GTO thyristor reliability by use of linear MOSFET amplifiers and controlled avalanching in gate drive circuits. In: 4th International Conference on Power Electronics and Variable-Speed Drives, 1990-7-17 to 1990-7-19, London, UK pp. 417-423..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:27
Last Modified: 27 Jun 2016 03:37
DOI: