Welland, ME and Baker, SD and Leane, RB and Milne, WI (1990) Scanning tunnelling microscopy of a-Si:H and polycrystalline silicon thin films. In: 21st Chelsea Conference on Amorphous and Liquid Semiconductors, -12-1989 to --, Chelsea, London.
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference Possibly appears in Philsophical Magazine B 62 (1) 1990. |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:50 |
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| Last Modified: | 15 Nov 2011 10:20 |
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| DOI: | |
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