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STM of ion etched surfaces

Bestwick, TD and Leane, RB and Welland, ME (1987) STM of ion etched surfaces. In: IEEE Semiconductor Interface Specialists Conference (SISC), 1987-12-1 to --, Florida, USA.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 23:56
Last Modified: 05 Feb 2015 02:19
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