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STM of ion etched surfaces

Bestwick, TD and Leane, RB and Welland, ME (1987) STM of ion etched surfaces. In: IEEE Semiconductor Interface Specialists Conference (SISC), 1987-12-1 to --, Florida, USA.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 15 Dec 2015 14:14
Last Modified: 06 May 2016 00:09
DOI: