CUED Publications database

Scanning tunnelling microscopy of Silicon surfaces

Welland, ME and Bestwick, TD (1987) Scanning tunnelling microscopy of Silicon surfaces. In: IEEE Conference on Materials Analysis for Electronic Devices, 1987-1-1 to --, London, UK.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:42
Last Modified: 23 Jul 2016 03:25
DOI: