CUED Publications database

Scanning tunnelling microscopy of Silicon surfaces

Welland, ME and Bestwick, TD (1987) Scanning tunnelling microscopy of Silicon surfaces. In: IEEE Conference on Materials Analysis for Electronic Devices, 1987-1-1 to --, London, UK.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:54
Last Modified: 17 Mar 2014 14:49
DOI: