Welland, ME and Bestwick, TD (1987) Scanning tunnelling microscopy of Silicon surfaces. In: IEEE Conference on Materials Analysis for Electronic Devices, 1-1-1987 to --, London, UK.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Event type = conference |
| Subjects: | UNSPECIFIED |
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| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:50 |
| Last Modified: | 15 Nov 2011 10:20 |
| DOI: |
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