CUED Publications database

Scanning tunnelling microscopy of Silicon surfaces

Welland, ME and Bestwick, TD (1987) Scanning tunnelling microscopy of Silicon surfaces. In: IEEE Conference on Materials Analysis for Electronic Devices, 1987-1-1 to --, London, UK.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:56
Last Modified: 31 Aug 2015 04:43
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