Zhu, H and Chu, DP and Fleck, NA and Rowley, SE and Saxena, SS (2009) Polarization change in ferroelectric thin film capacitors under external stress. Journal of Applied Physics, 105. 061609-. ISSN 0021-8979Full text not available from this repository.
|Divisions:||Div C > Materials Engineering|
|Depositing User:||Unnamed user with email firstname.lastname@example.org|
|Date Deposited:||18 May 2016 19:40|
|Last Modified:||27 Aug 2016 22:46|