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The use of condition maps in the design and testing of power electronic circuits and devices

Bryant, AT and Parker Allotey, NA and Palmer, PR (2007) The use of condition maps in the design and testing of power electronic circuits and devices. IEEE Transactions on Industry Applications, 43. pp. 902-910. ISSN 0093-9994

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 12:53
Last Modified: 04 May 2016 05:52
DOI: 10.1109/TIA.2007.900470