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The use of condition maps in the design and testing of power electronic circuits and devices

Bryant, AT and Parker Allotey, NA and Palmer, PR (2007) The use of condition maps in the design and testing of power electronic circuits and devices. IEEE Transactions on Industry Applications, 43. pp. 902-910. ISSN 0093-9994

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:30
Last Modified: 01 May 2015 19:29
DOI: 10.1109/TIA.2007.900470