CUED Publications database

Sensitivity map generation in electrical capacitance tomography using mixed normalization models

Yong Song, K and Seong Hun, L and Umer Zeeshan, I and Kyung Youn, K and Bong Yeol, C (2007) Sensitivity map generation in electrical capacitance tomography using mixed normalization models. Measurement Science and Technology, 18. pp. 2092-2102. ISSN 0957-0233

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Item Type: Article
Uncontrolled Keywords: sensitivity map, electrical capacitance tomography, thresholding model, adaptive model
Subjects: UNSPECIFIED
Divisions: Div F > Machine Intelligence
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:37
Last Modified: 05 Feb 2015 07:02
DOI: 10.1088/0957-0233/18/7/040