CUED Publications database

Defect states in the high-dielectric-constant gate oxide HfSiO4

Xiong, K and Du, Y and Tse, K and Robertson, J (2007) Defect states in the high-dielectric-constant gate oxide HfSiO4. Journal of Applied Physics, 101. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 09 Dec 2016 17:44
Last Modified: 10 Dec 2016 01:02
DOI: