CUED Publications database

Defect states in the high-dielectric-constant gate oxide HfSiO4

Xiong, K and Du, Y and Tse, K and Robertson, J (2007) Defect states in the high-dielectric-constant gate oxide HfSiO4. Journal of Applied Physics, 101. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:04
Last Modified: 26 Mar 2015 01:31
DOI: 10.1063/1.2409662