CUED Publications database

Defect states in the high-dielectric-constant gate oxide HfSiO4

Xiong, K and Du, Y and Tse, K and Robertson, J (2007) Defect states in the high-dielectric-constant gate oxide HfSiO4. Journal of Applied Physics, 101. ISSN 0021-8979

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 17:59
Last Modified: 26 May 2016 23:24
DOI: 10.1063/1.2409662