CUED Publications database

Model-based design analysis and yield optimization

Pfingsten, T and Herrmann, D and Rasmussen, CE (2006) Model-based design analysis and yield optimization. IEEE Transactions on Semiconductor Manufacturing, 19. pp. 475-486. ISSN 0894-6507

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div F > Computational and Biological Learning
Depositing User: Cron Job
Date Deposited: 09 Dec 2016 18:14
Last Modified: 22 Jan 2017 01:30
DOI: