CUED Publications database

Model-based design analysis and yield optimization

Pfingsten, T and Herrmann, D and Rasmussen, CE (2006) Model-based design analysis and yield optimization. IEEE Transactions on Semiconductor Manufacturing, 19. pp. 475-486. ISSN 0894-6507

Full text not available from this repository.
Item Type: Article
Divisions: Div F > Computational and Biological Learning
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 12:53
Last Modified: 02 May 2016 11:28
DOI: 10.1109/TSM.2006.883589