CUED Publications database

Model-based design analysis and yield optimization

Pfingsten, T and Herrmann, D and Rasmussen, CE (2006) Model-based design analysis and yield optimization. IEEE Transactions on Semiconductor Manufacturing, 19. pp. 475-486. ISSN 0894-6507

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div F > Computational and Biological Learning
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 17:24
Last Modified: 29 Sep 2016 11:11
DOI: