Pfingsten, T and Herrmann, D and Rasmussen, CE (2006) Model-based design analysis and yield optimization. IEEE Transactions on Semiconductor Manufacturing, 19. pp. 475-486. ISSN 0894-6507
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div F > Computational and Biological Learning |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:47 |
| Last Modified: | 15 Nov 2011 10:19 |
| DOI: | 10.1109/TSM.2006.883589 |
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