Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093
Full text not available from this repository.Item Type: | Article |
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Subjects: | UNSPECIFIED |
Divisions: | Div B > Solid State Electronics and Nanoscale Science |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 20:06 |
Last Modified: | 14 Dec 2017 02:15 |
DOI: |