Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Unnamed user with email firstname.lastname@example.org|
|Date Deposited:||18 May 2016 17:52|
|Last Modified:||25 Aug 2016 00:14|