Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093
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|Item Type: ||Article|
|Additional Information: ||This journal contains the Proceedings of the 21st International Conference on Amorphous and Nanocrystalline Semiconductors - Science and Technology, Calouste Gulbenkian Foundation, Lisbon, Portugal 04-09 September 2005. Edited by Rodrigo Martins, Virginia Chu, Elvira Fortunato, João Pedro Conde and Isabel Ferreira.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:47|
|Last Modified: ||16 May 2013 19:21|
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