CUED Publications database

Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors

Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:25
Last Modified: 01 May 2015 18:36
DOI: 10.1016/j.jnoncrysol.2005.12.025