CUED Publications database

Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors

Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:15
Last Modified: 31 Aug 2015 07:58
DOI: 10.1016/j.jnoncrysol.2005.12.025