Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors

Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093

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Item Type:	Article
Subjects:	UNSPECIFIED
Divisions:	Div B > Solid State Electronics and Nanoscale Science
Depositing User:	Cron Job
Date Deposited:	02 Sep 2016 17:49
Last Modified:	25 Sep 2016 02:42
DOI:

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