Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093
Full text not available from this repository.
| Item Type: | Article |
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| Additional Information: | This journal contains the Proceedings of the 21st International Conference on Amorphous and Nanocrystalline Semiconductors - Science and Technology, Calouste Gulbenkian Foundation, Lisbon, Portugal 04-09 September 2005. Edited by Rodrigo Martins, Virginia Chu, Elvira Fortunato, João Pedro Conde and Isabel Ferreira. |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:47 |
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| Last Modified: | 30 Dec 2013 01:22 |
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| DOI: | 10.1016/j.jnoncrysol.2005.12.025 |
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