CUED Publications database

Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors

Flewitt, AJ and Lin, S and Milne, WI (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 13:10
Last Modified: 08 Feb 2016 08:20
DOI: 10.1016/j.jnoncrysol.2005.12.025