Johnson, S and Markwitz, A and Rudolphi, M and Bauhman, H and Oei, SP and Teo, KBK (2006) Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing. Current Applied Physics, 6. pp. 503-506. ISSN 1567-1739
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|Item Type: ||Article|
|Additional Information: ||This journal contains the Proceedings of the Second International Conference on Advanced Materials and Nanotechnology (AMN-20), AMN-2 (Second International Conference on Advanced Materials and Nanotechnology) Queenstown, New Zealand 06-11 February 2005. Edited by R.J. Blaikie and A.J. Downard.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:47|
|Last Modified: ||27 May 2013 01:22|
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