Johnson, S and Markwitz, A and Rudolphi, M and Bauhman, H and Oei, SP and Teo, KBK (2006) Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing. Current Applied Physics, 6. pp. 503-506. ISSN 1567-1739Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||18 May 2016 18:09|
|Last Modified:||23 Jul 2016 23:24|