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Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing

Johnson, S and Markwitz, A and Rudolphi, M and Bauhman, H and Oei, SP and Teo, KBK (2006) Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing. Current Applied Physics, 6. pp. 503-506. ISSN 1567-1739

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:38
Last Modified: 06 Oct 2014 01:23
DOI: 10.1016/j.cap.2005.11.049

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