Johnson, S and Markwitz, A and Rudolphi, M and Bauhman, H and Oei, SP and Teo, KBK (2006) Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing. Current Applied Physics, 6. pp. 503-506. ISSN 1567-1739Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||09 Dec 2016 17:19|
|Last Modified:||27 Apr 2017 01:35|