CUED Publications database

Influence of trap states on dynamic properties of single grain silicon thin film transistors

Yan, F and Migliorato, P and Ishihara, R (2006) Influence of trap states on dynamic properties of single grain silicon thin film transistors. Applied Physics Letters, 88. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:09
Last Modified: 01 May 2015 19:05
DOI: 10.1063/1.2193049