CUED Publications database

Influence of trap states on dynamic properties of single grain silicon thin film transistors

Yan, F and Migliorato, P and Ishihara, R (2006) Influence of trap states on dynamic properties of single grain silicon thin film transistors. Applied Physics Letters, 88. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:38
Last Modified: 07 Apr 2014 01:17
DOI: 10.1063/1.2193049

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