CUED Publications database

Influence of trap states on dynamic properties of single grain silicon thin film transistors

Yan, F and Migliorato, P and Ishihara, R (2006) Influence of trap states on dynamic properties of single grain silicon thin film transistors. Applied Physics Letters, 88. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Additional Information: 3 pages, from 153507-1 to 153507-3.
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron Job
Date Deposited: 28 Oct 2011 16:47
Last Modified: 11 Mar 2013 01:47
DOI: 10.1063/1.2193049

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