CUED Publications database

Bonding and interface states of Si:HfO2 and Si:ZrO2 interfaces

Peacock, PW and Xiong, K and Tse, K and Robertson, J (2006) Bonding and interface states of Si:HfO2 and Si:ZrO2 interfaces. Physical Review B: Condensed Matter and Materials Physics, 73. 075328-. ISSN 1098-0121

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:06
Last Modified: 27 Jun 2016 07:32
DOI: 10.1103/PhysRevB.73.075328