CUED Publications database

Bonding and interface states of Si:HfO2 and Si:ZrO2 interfaces

Peacock, PW and Xiong, K and Tse, K and Robertson, J (2006) Bonding and interface states of Si:HfO2 and Si:ZrO2 interfaces. Physical Review B: Condensed Matter and Materials Physics, 73. 075328-. ISSN 1098-0121

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:06
Last Modified: 28 Aug 2016 22:19
DOI: