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Bonding and interface states of Si:HfO2 and Si:ZrO2 interfaces

Peacock, PW and Xiong, K and Tse, K and Robertson, J (2006) Bonding and interface states of Si:HfO2 and Si:ZrO2 interfaces. Physical Review B: Condensed Matter and Materials Physics, 73. 075328-. ISSN 1098-0121

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 15 Dec 2015 12:54
Last Modified: 11 Feb 2016 03:08
DOI: 10.1103/PhysRevB.73.075328