CUED Publications database

Defect energy levels in HfO2 high-dielectric-constant gate oxide

Xiong, K and Robertson, J and Gibson, MC and Clark, SJ (2005) Defect energy levels in HfO2 high-dielectric-constant gate oxide. Applied Physics Letters, 87. 183505-. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 17:59
Last Modified: 27 Jul 2016 22:05
DOI: 10.1063/1.2119425