CUED Publications database

Defect energy levels in HfO2 high-dielectric-constant gate oxide

Xiong, K and Robertson, J and Gibson, MC and Clark, SJ (2005) Defect energy levels in HfO2 high-dielectric-constant gate oxide. Applied Physics Letters, 87. 183505-. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:04
Last Modified: 26 May 2015 10:59
DOI: 10.1063/1.2119425