CUED Publications database

Defect energy levels in HfO2 high-dielectric-constant gate oxide

Xiong, K and Robertson, J and Gibson, MC and Clark, SJ (2005) Defect energy levels in HfO2 high-dielectric-constant gate oxide. Applied Physics Letters, 87. 183505-. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:22
Last Modified: 17 Nov 2014 01:05
DOI: 10.1063/1.2119425