CUED Publications database

Absence of enhanced stability in fully-deuterated amorphous silicon thin film transistors

Wehrspohn, R and Lin, S and Flewitt, AJ and Milne, WI and Powell, MJ (2005) Absence of enhanced stability in fully-deuterated amorphous silicon thin film transistors. Journal of Applied Physics, 98. 054505-. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 16:46
Last Modified: 29 Sep 2016 09:32
DOI: