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Absence of enhanced stability in fully-deuterated amorphous silicon thin film transistors

Wehrspohn, R and Lin, S and Flewitt, AJ and Milne, WI and Powell, MJ (2005) Absence of enhanced stability in fully-deuterated amorphous silicon thin film transistors. Journal of Applied Physics, 98. 054505-. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:15
Last Modified: 04 Sep 2015 02:34
DOI: 10.1063/1.2039267