CUED Publications database

Absence of enhanced stability in fully-deuterated amorphous silicon thin film transistors

Wehrspohn, R and Lin, S and Flewitt, AJ and Milne, WI and Powell, MJ (2005) Absence of enhanced stability in fully-deuterated amorphous silicon thin film transistors. Journal of Applied Physics, 98. 054505-. ISSN 0021-8979

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 09 Dec 2016 17:51
Last Modified: 18 Jan 2017 03:18
DOI: