Yan, F and Migliorato, P and Hong, Y and Rana, V and Ishihara, R and Hiroshima, Y and Abe, D and Inoue, S and Shimoda, T (2005) Gate oxide induced switch-on undershoot current observed in thin-film transistors. Applied Physics Letters, 86. ISSN 0003-6951
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|Item Type: ||Article|
|Additional Information: ||3 pages, from 253504-1 to 253504-3.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:46|
|Last Modified: ||23 Sep 2013 01:10|
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