Yan, F and Migliorato, P and Hong, Y and Rana, V and Ishihara, R and Hiroshima, Y and Abe, D and Inoue, S and Shimoda, T (2005) Gate oxide induced switch-on undershoot current observed in thin-film transistors. Applied Physics Letters, 86. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||07 Mar 2014 11:38|
|Last Modified:||14 Jul 2014 01:08|
Actions (login required)