Yan, F and Migliorato, P and Hong, Y and Rana, V and Ishihara, R and Hiroshima, Y and Abe, D and Inoue, S and Shimoda, T (2005) Gate oxide induced switch-on undershoot current observed in thin-film transistors. Applied Physics Letters, 86. ISSN 0003-6951Full text not available from this repository.
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|Date Deposited:||16 Jul 2015 13:46|
|Last Modified:||25 Jul 2015 23:47|