Yan, F and Migliorato, P and Hong, Y and Rana, V and Ishihara, R and Hiroshima, Y and Abe, D and Inoue, S and Shimoda, T (2005) Gate oxide induced switch-on undershoot current observed in thin-film transistors. Applied Physics Letters, 86. ISSN 0003-6951Full text not available from this repository.
|Depositing User:||Cron job|
|Date Deposited:||04 Feb 2015 22:11|
|Last Modified:||05 Feb 2015 00:15|