CUED Publications database

Instability measurements in amorphous hydrogenated silicon using capacitance-voltage techniques

Paul, S and Flewitt, AJ and Milne, WI and Robertson, J (2005) Instability measurements in amorphous hydrogenated silicon using capacitance-voltage techniques. Applied Physics Letters, 86. 202110-. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:38
Last Modified: 30 Sep 2014 19:13
DOI: 10.1063/1.1928315

Actions (login required)

View Item