CUED Publications database

Instability measurements in amorphous hydrogenated silicon using capacitance-voltage techniques

Paul, S and Flewitt, AJ and Milne, WI and Robertson, J (2005) Instability measurements in amorphous hydrogenated silicon using capacitance-voltage techniques. Applied Physics Letters, 86. 202110-. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:25
Last Modified: 24 May 2016 22:04
DOI: 10.1063/1.1928315