CUED Publications database

Point defects in ZrO2 high K gate oxide

Robertson, J and Xiong, K and Falabretti, B (2005) Point defects in ZrO2 high K gate oxide. IEEE Transactions on Device and Materials Reliability, 5. pp. 84-89. ISSN 1530-4388

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Item Type: Article
Divisions: Div B > Electronics, Power & Energy Conversion
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:47
Last Modified: 26 Jan 2015 03:31
DOI: 10.1109/TDMR.2005.845476