CUED Publications database

Point defects in ZrO2 high K gate oxide

Robertson, J and Xiong, K and Falabretti, B (2005) Point defects in ZrO2 high K gate oxide. IEEE Transactions on Device and Materials Reliability, 5. pp. 84-89. ISSN 1530-4388

Full text not available from this repository.
Item Type: Article
Divisions: Div B > Electronics, Power & Energy Conversion
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:21
Last Modified: 07 Mar 2019 13:59
DOI: 10.1109/TDMR.2005.845476