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The stability of fully deuterated amorphous silicon thin film transistors

Lin, S and Flewitt, AJ and Milne, WI and Wehrspohn, RB and Powell, MJ (2005) The stability of fully deuterated amorphous silicon thin film transistors. Applied Physics Letters, 86. 063513-. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:38
Last Modified: 06 Oct 2014 01:23
DOI: 10.1063/1.1862755

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