CUED Publications database

The stability of fully deuterated amorphous silicon thin film transistors

Lin, S and Flewitt, AJ and Milne, WI and Wehrspohn, RB and Powell, MJ (2005) The stability of fully deuterated amorphous silicon thin film transistors. Applied Physics Letters, 86. 063513-. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 19:08
Last Modified: 30 May 2016 06:38
DOI: 10.1063/1.1862755