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The stability of fully deuterated amorphous silicon thin film transistors

Lin, S and Flewitt, AJ and Milne, WI and Wehrspohn, RB and Powell, MJ (2005) The stability of fully deuterated amorphous silicon thin film transistors. Applied Physics Letters, 86. 063513-. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 02 Sep 2016 17:49
Last Modified: 27 Sep 2016 22:49
DOI: