CUED Publications database

The stability of fully deuterated amorphous silicon thin film transistors

Lin, S and Flewitt, AJ and Milne, WI and Wehrspohn, RB and Powell, MJ (2005) The stability of fully deuterated amorphous silicon thin film transistors. Applied Physics Letters, 86. 063513-. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:15
Last Modified: 30 Jul 2015 01:35
DOI: 10.1063/1.1862755