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Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs

Karim, KS and Nathan, A and Hack, M and Milne, WI (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters, 25. pp. 188-190. ISSN 0741-3106

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:26
Last Modified: 17 Mar 2014 14:30
DOI:

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