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Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs

Karim, KS and Nathan, A and Hack, M and Milne, WI (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters, 25. pp. 188-190. ISSN 0741-3106

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:07
Last Modified: 29 Aug 2015 22:11
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