Karim, KS and Nathan, A and Hack, M and Milne, WI (2004) Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs. IEEE Electron Device Letters, 25. pp. 188-190. ISSN 0741-3106
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:45 |
| Last Modified: | 03 Jun 2013 01:10 |
| DOI: |
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