CUED Publications database

Atomic structure, band offsets, growth and defects at High-K oxide Si interfaces

Robertson, J and Peacock, PW (2004) Atomic structure, band offsets, growth and defects at High-K oxide Si interfaces. Microelectronic Engineering, 72. pp. 112-120. ISSN 0167-9317

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:04
Last Modified: 03 Aug 2015 06:53
DOI: 10.1016/j.mee.2003.12.026