Robertson, J and Peacock, PW (2004) Atomic structure, band offsets, growth and defects at High-K oxide Si interfaces. Microelectronic Engineering, 72. pp. 112-120. ISSN 0167-9317
Full text not available from this repository.
| Item Type: | Article |
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| Additional Information: | This journal contains the Proceedings of the 13th Biennial Conference on Insulating Films on Semiconductors held in Barcelona, 18 - 20 June 2003. Edited by Joan Ramon Morante Lleonart |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Electronics, Power & Energy Conversion |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:45 |
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| Last Modified: | 20 May 2013 01:40 |
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| DOI: | 10.1016/j.mee.2003.12.026 |
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