CUED Publications database

Atomic structure, band offsets, growth and defects at High-K oxide Si interfaces

Robertson, J and Peacock, PW (2004) Atomic structure, band offsets, growth and defects at High-K oxide Si interfaces. Microelectronic Engineering, 72. pp. 112-120. ISSN 0167-9317

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:28
Last Modified: 01 May 2015 18:27
DOI: 10.1016/j.mee.2003.12.026