Peacock, PW and Robertson, J (2004) Bonding, energies, and band offsets of Si–ZrO2 and HfO2 gate oxide interfaces. Physical Review Letters, 92. 057601-. ISSN 0031-9007
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Electronics, Power & Energy Conversion |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:45 |
| Last Modified: | 16 May 2013 19:23 |
| DOI: | 10.1103/PhysRevLett.92.057601 |
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