Gademann, A and Durkan, C and Shvets, IV (2003) Optical impedance matching with scanning near-field optical microscopy. Journal of Physics D: Applied Physics, 36. pp. 2193-2197. ISSN 0022-3727
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:44 |
| Last Modified: | 11 Mar 2013 01:56 |
| DOI: |
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