Chu, DP and Zhang, ZG and Migliorato, P and McGregor, BM and Ohashi, K and Hasegawa, K and Shimoda, T (2002) Thickness of the near-interface regions and central bulk ohmic resistivity in lead lanthanum zirconate titanate ferroelectric thin films. Applied Physics Letters, 91. pp. 5204-5206. ISSN 0003-6951
Full text not available from this repository.
| Item Type: | Article |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:44 |
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| Last Modified: | 15 Nov 2011 10:18 |
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| DOI: | 10.1063/1.1532548 |
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