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Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating

Kimura, M and Inoue, S and Shimoda, T and Tam, SBW and Lui, BOK and Migliorato, P and Nozawa, R (2002) Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating. Journal of Applied Physics, 91. pp. 3855-3858. ISSN 0021-8979

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:10
Last Modified: 04 Sep 2015 21:47
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