Kimura, M and Inoue, S and Shimoda, T and Tam, SBW and Lui, BOK and Migliorato, P and Nozawa, R (2002) Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating. Journal of Applied Physics, 91. pp. 3855-3858. ISSN 0021-8979
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|Item Type: ||Article|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:44|
|Last Modified: ||27 May 2013 01:21|
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