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Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating

Kimura, M and Inoue, S and Shimoda, T and Tam, SBW and Lui, BOK and Migliorato, P and Nozawa, R (2002) Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating. Journal of Applied Physics, 91. pp. 3855-3858. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron Job
Date Deposited: 28 Oct 2011 16:44
Last Modified: 27 May 2013 01:21
DOI:

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