Kimura, M and Inoue, S and Shimoda, T and Tam, SBW and Lui, BOK and Migliorato, P and Nozawa, R (2002) Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating. Journal of Applied Physics, 91. pp. 3855-3858. ISSN 0021-8979Full text not available from this repository.
|Depositing User:||Cron job|
|Date Deposited:||04 Feb 2015 22:40|
|Last Modified:||09 May 2015 11:05|