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Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating

Kimura, M and Inoue, S and Shimoda, T and Tam, SBW and Lui, BOK and Migliorato, P and Nozawa, R (2002) Extraction of trap states in laser-crystallized polycrystalline-silicon thin-film transistors and analysis of degradation by self-heating. Journal of Applied Physics, 91. pp. 3855-3858. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:40
Last Modified: 09 May 2015 11:05
DOI: