Caldwell, NHM and Breton, BC and Holburn, DM (2001) XpertEze: developing embedded intelligence for the scanning electron microscope. Microscopy and Microanalysis, 7. pp. 966-967. ISSN 1431-9276
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Engineering Design |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:37 |
| Last Modified: | 13 May 2013 01:02 |
| DOI: |
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