Kimura, M and Nozawa, R and Inoue, S and Shimoda, T and Lui, BOK and Tam, SWB and Migliorato, P (2001) Extraction of trap states at the oxide-Silicon interface and grain boundary in polycrystalline Silicon thin-film transistors. Japanese Journal of Applied Physics, 40. pp. 112-113. ISSN 0021-4922Full text not available from this repository.
|Depositing User:||Cron job|
|Date Deposited:||16 Jul 2015 14:04|
|Last Modified:||30 Nov 2015 17:01|