Kimura, M and Nozawa, R and Inoue, S and Shimoda, T and Lui, BOK and Tam, SWB and Migliorato, P (2001) Extraction of trap states at the oxide-Silicon interface and grain boundary in polycrystalline Silicon thin-film transistors. Japanese Journal of Applied Physics, 40. pp. 112-113. ISSN 0021-4922
Full text not available from this repository.
|Item Type: ||Article|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:44|
|Last Modified: ||20 May 2013 01:33|
Actions (login required)