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Method for the determination of bulk and interface density of states in thin-film transistors

Lui, OKB and Tam, SWB and Migliorato, P and Shimoda, T (2001) Method for the determination of bulk and interface density of states in thin-film transistors. Journal of Applied Physics, 89. pp. 6453-6458. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:54
Last Modified: 31 Aug 2015 10:14
DOI: