Migliorato, P and Tam, SWB and Lui, OKB and Shimoda, T (2001) Determination of the surface potential in thin-film transistors from C-V measurements. Journal of Applied Physics, 89. pp. 6449-6452. ISSN 0021-8979
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:43 |
| Last Modified: | 15 Nov 2011 10:18 |
| DOI: |
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