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Determination of the surface potential in thin-film transistors from C-V measurements

Migliorato, P and Tam, SWB and Lui, OKB and Shimoda, T (2001) Determination of the surface potential in thin-film transistors from C-V measurements. Journal of Applied Physics, 89. pp. 6449-6452. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 23:54
Last Modified: 05 Feb 2015 02:16
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