Electrical testing of gold nanostructures by conducting atomic force microscopy

Bietsch, A and Schneider, MA and Welland, ME (2000) Electrical testing of gold nanostructures by conducting atomic force microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18. pp. 1160-1170. ISSN 1071-1023

Full text not available from this repository.

Item Type:	Article
Subjects:	UNSPECIFIED
Divisions:	Div B > Solid State Electronics and Nanoscale Science
Depositing User:	Cron Job
Date Deposited:	17 Jul 2017 19:29
Last Modified:	18 Jul 2017 10:26
DOI:

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