Bietsch, A and Schneider, MA and Welland, ME (2000) Electrical testing of gold nanostructures by conducting atomic force microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18. pp. 1160-1170. ISSN 1071-1023
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 07 Mar 2014 11:36 |
| Last Modified: | 17 Mar 2014 14:49 |
| DOI: |
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