Bietsch, A and Schneider, MA and Welland, ME (2000) Electrical testing of gold nanostructures by conducting atomic force microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18. pp. 1160-1170. ISSN 1071-1023
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Unnamed user with email sms67@cam.ac.uk |
| Date Deposited: | 02 Sep 2016 17:09 |
| Last Modified: | 25 Sep 2016 22:18 |
| DOI: |
