CUED Publications database

Electrical testing of gold nanostructures by conducting atomic force microscopy

Bietsch, A and Schneider, MA and Welland, ME (2000) Electrical testing of gold nanostructures by conducting atomic force microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18. pp. 1160-1170. ISSN 1071-1023

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:45
Last Modified: 26 Jul 2015 02:59
DOI: