CUED Publications database

Electrical testing of gold nanostructures by conducting atomic force microscopy

Bietsch, A and Schneider, MA and Welland, ME (2000) Electrical testing of gold nanostructures by conducting atomic force microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18. pp. 1160-1170. ISSN 1071-1023

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:29
Last Modified: 21 Nov 2017 03:25
DOI: