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Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors

Brown, TM and Migliorato, P (2000) Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors. Applied Physics Letters, 76. pp. 1024-1026. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:36
Last Modified: 17 Mar 2014 14:42
DOI:

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