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Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors

Brown, TM and Migliorato, P (2000) Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors. Applied Physics Letters, 76. pp. 1024-1026. ISSN 0003-6951

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:33
Last Modified: 25 Jul 2015 23:47
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