CUED Publications database

Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors

Brown, TM and Migliorato, P (2000) Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors. Applied Physics Letters, 76. pp. 1024-1026. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:33
Last Modified: 28 Aug 2015 02:31
DOI: