Durkan, C and Chu, DP and Migliorato, P and Welland, ME (2000) Investigations into local piezoelectric properties by atomic force microscopy. Applied Physics Letters, 76. pp. 366-368. ISSN 0003-6951
Full text not available from this repository.Item Type: | Article |
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Subjects: | UNSPECIFIED |
Divisions: | Div B > Photonics Div B > Solid State Electronics and Nanoscale Science |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 19:31 |
Last Modified: | 18 Feb 2021 15:41 |
DOI: | 10.1063/1.125756 |