Durkan, C and Chu, DP and Migliorato, P and Welland, ME (2000) Investigations into local piezoelectric properties by atomic force microscopy. Applied Physics Letters, 76. pp. 366-368. ISSN 0003-6951
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Photonics Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 07 Mar 2014 11:36 |
| Last Modified: | 02 Jun 2014 01:15 |
| DOI: | 10.1063/1.125756 |
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