CUED Publications database

Investigations into local piezoelectric properties by atomic force microscopy

Durkan, C and Chu, DP and Migliorato, P and Welland, ME (2000) Investigations into local piezoelectric properties by atomic force microscopy. Applied Physics Letters, 76. pp. 366-368. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:34
Last Modified: 02 Jul 2016 01:54
DOI: 10.1063/1.125756