Durkan, C and Chu, DP and Migliorato, P and Welland, ME (2000) Investigations into local piezoelectric properties by atomic force microscopy. Applied Physics Letters, 76. pp. 366-368. ISSN 0003-6951
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Photonics Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 17 Jul 2017 19:31 |
| Last Modified: | 18 Feb 2021 15:41 |
| DOI: | 10.1063/1.125756 |
