CUED Publications database

Investigations into local piezoelectric properties by atomic force microscopy

Durkan, C and Chu, DP and Migliorato, P and Welland, ME (2000) Investigations into local piezoelectric properties by atomic force microscopy. Applied Physics Letters, 76. pp. 366-368. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 12:50
Last Modified: 29 Apr 2016 02:57
DOI: 10.1063/1.125756