Durkan, C and Welland, ME (2000) Analysis of failure mechanisms in electrically stressed gold nanowires. Ultramicroscopy, 82. pp. 125-133. ISSN 0304-3991
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:43 |
| Last Modified: | 10 Jun 2013 01:05 |
| DOI: |
Actions (login required)
| View Item |
