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Analysis of failure mechanisms in electrically stressed gold nanowires

Durkan, C and Welland, ME (2000) Analysis of failure mechanisms in electrically stressed gold nanowires. Ultramicroscopy, 82. pp. 125-133. ISSN 0304-3991

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:05
Last Modified: 05 Sep 2015 02:03
DOI: