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Analysis of failure mechanisms in electrically stressed gold nanowires

Durkan, C and Welland, ME (2000) Analysis of failure mechanisms in electrically stressed gold nanowires. Ultramicroscopy, 82. pp. 125-133. ISSN 0304-3991

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:27
Last Modified: 15 Sep 2014 01:05
DOI:

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