Durkan, C and Welland, ME (2000) Nanometer scale electrical characterization of artificial mesostructures. Critical Reviews in Solid State and Materials Science, 25. pp. 1-28. ISSN 1040-8436
Full text not available from this repository.| Item Type: | Article |
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| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:43 |
| Last Modified: | 20 May 2013 01:38 |
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