Kalkbrenner, T and Graf, M and Durkan, C and Mlynek, J and Sandoghdar, V (2000) High-contrast topography-free sample for near-field optical microscopy. Applied Physics Letters, 76. pp. 1206-1208. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Unnamed user with email firstname.lastname@example.org|
|Date Deposited:||09 Dec 2016 18:31|
|Last Modified:||24 Apr 2017 01:08|