CUED Publications database

High-contrast topography-free sample for near-field optical microscopy

Kalkbrenner, T and Graf, M and Durkan, C and Mlynek, J and Sandoghdar, V (2000) High-contrast topography-free sample for near-field optical microscopy. Applied Physics Letters, 76. pp. 1206-1208. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:55
Last Modified: 24 Aug 2016 06:23
DOI: