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Analysis of failure mechanisms in electrically stressed Au nanowires

Durkan, C and Schneider, MA and Welland, ME (1999) Analysis of failure mechanisms in electrically stressed Au nanowires. Journal of Applied Physics, 86. pp. 1280-1286. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:21
Last Modified: 16 Apr 2014 21:46
DOI:

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