CUED Publications database

Analysis of failure mechanisms in electrically stressed Au nanowires

Durkan, C and Schneider, MA and Welland, ME (1999) Analysis of failure mechanisms in electrically stressed Au nanowires. Journal of Applied Physics, 86. pp. 1280-1286. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:06
Last Modified: 01 May 2015 19:07
DOI: