CUED Publications database

Analysis of failure mechanisms in electrically stressed Au nanowires

Durkan, C and Schneider, MA and Welland, ME (1999) Analysis of failure mechanisms in electrically stressed Au nanowires. Journal of Applied Physics, 86. pp. 1280-1286. ISSN 0021-8979

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:06
Last Modified: 29 Jul 2015 21:19
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