Durkan, C and Schneider, MA and Welland, ME (1999) Analysis of failure mechanisms in electrically stressed Au nanowires. Journal of Applied Physics, 86. pp. 1280-1286. ISSN 0021-8979
Full text not available from this repository.| Item Type: | Article |
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| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:43 |
| Last Modified: | 25 Mar 2013 01:14 |
| DOI: |
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