Palinginis, KC and Lubianiker, Y and Cohen, JD and Ilie, A and Kleinsorge, B and Milne, WI (1999) Defect densities in tetrahedrally bonded amorphous carbon deduced by junction capacitance techniques. Applied Physics Letters, 74. pp. 371-373. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||18 May 2016 19:15|
|Last Modified:||25 Jul 2016 08:01|