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Defect densities in tetrahedrally bonded amorphous carbon deduced by junction capacitance techniques

Palinginis, KC and Lubianiker, Y and Cohen, JD and Ilie, A and Kleinsorge, B and Milne, WI (1999) Defect densities in tetrahedrally bonded amorphous carbon deduced by junction capacitance techniques. Applied Physics Letters, 74. pp. 371-373. ISSN 0003-6951

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Item Type: Article
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:14
Last Modified: 30 Aug 2015 02:05
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