Palinginis, KC and Lubianiker, Y and Cohen, JD and Ilie, A and Kleinsorge, B and Milne, WI (1999) Defect densities in tetrahedrally bonded amorphous carbon deduced by junction capacitance techniques. Applied Physics Letters, 74. pp. 371-373. ISSN 0003-6951
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|Item Type: ||Article|
|Additional Information: ||Unmapped Imported Data : Isbn = 1558995013|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:43|
|Last Modified: ||27 May 2013 01:21|
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