Palinginis, KC and Lubianiker, Y and Cohen, JD and Ilie, A and Kleinsorge, B and Milne, WI (1999) Defect densities in tetrahedrally bonded amorphous carbon deduced by junction capacitance techniques. Applied Physics Letters, 74. pp. 371-373. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||15 Dec 2015 13:13|
|Last Modified:||07 Feb 2016 23:44|