Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1998) Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. Applied Physics Letters, 72. pp. 915-917. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||15 Dec 2015 12:59|
|Last Modified:||04 May 2016 00:34|