CUED Publications database

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1998) Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. Applied Physics Letters, 72. pp. 915-917. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:41
Last Modified: 08 Dec 2014 02:11
DOI: