CUED Publications database

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1998) Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. Applied Physics Letters, 72. pp. 915-917. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 15 Dec 2015 12:59
Last Modified: 04 May 2016 00:34
DOI: