CUED Publications database

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1998) Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. Applied Physics Letters, 72. pp. 915-917. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:44
Last Modified: 05 Feb 2015 00:59
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