CUED Publications database

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1998) Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. Applied Physics Letters, 72. pp. 915-917. ISSN 0003-6951

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:25
Last Modified: 03 Sep 2015 22:00
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