CUED Publications database

Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

Durkan, C and Shvets, IV (1998) Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light. Journal of Applied Physics, 83. pp. 1171-1176. ISSN 0021-8979

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:06
Last Modified: 31 Aug 2015 09:55
DOI: