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Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

Durkan, C and Shvets, IV (1998) Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light. Journal of Applied Physics, 83. pp. 1171-1176. ISSN 0021-8979

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:35
Last Modified: 17 Mar 2014 14:51
DOI:

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