CUED Publications database

Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

O'Shea, SJ and Lantz, MA and Welland, ME (1998) Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum. Review of Scientific Instruments, 69. pp. 1757-1764. ISSN 0034-6748

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 17:15
Last Modified: 07 Dec 2016 01:59
DOI: