O'Shea, SJ and Lantz, MA and Welland, ME (1998) Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum. Review of Scientific Instruments, 69. pp. 1757-1764. ISSN 0034-6748Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||15 Dec 2015 13:22|
|Last Modified:||04 May 2016 22:58|