CUED Publications database

Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

O'Shea, SJ and Lantz, MA and Welland, ME (1998) Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum. Review of Scientific Instruments, 69. pp. 1757-1764. ISSN 0034-6748

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 15 Dec 2015 13:22
Last Modified: 04 May 2016 22:58
DOI: