Lantz, MA and O'Shea, SJ and Welland, ME (1997) Simultaneous force and conduction measurements in atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics, 56. ISSN 0163-1829
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:42 |
| Last Modified: | 11 Mar 2013 01:48 |
| DOI: |
Actions (login required)
| View Item |
