Lantz, MA and O'Shea, SJ and Welland, ME (1997) Simultaneous force and conduction measurements in atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics, 56. ISSN 0163-1829Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||18 May 2016 18:42|
|Last Modified:||30 May 2016 05:22|