Lantz, MA and O'Shea, SJ and Welland, ME (1997) Simultaneous force and conduction measurements in atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics, 56. ISSN 0163-1829Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||18 May 2016 18:42|
|Last Modified:||23 Jul 2016 22:26|