CUED Publications database

Simultaneous force and conduction measurements in atomic force microscopy

Lantz, MA and O'Shea, SJ and Welland, ME (1997) Simultaneous force and conduction measurements in atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics, 56. ISSN 0163-1829

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:35
Last Modified: 08 Dec 2014 02:39
DOI: