CUED Publications database

Simultaneous force and conduction measurements in atomic force microscopy

Lantz, MA and O'Shea, SJ and Welland, ME (1997) Simultaneous force and conduction measurements in atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics, 56. ISSN 0163-1829

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:42
Last Modified: 23 Jul 2016 22:26
DOI: