CUED Publications database

FIRST A.I.D.: using remote microscopy and artificial intelligence for SEM fault diagnosis

Caldwell, NHM and Breton, BC and Holburn, DM (1997) FIRST A.I.D.: using remote microscopy and artificial intelligence for SEM fault diagnosis. Scanning: The Journal of Scanning Microscopies, 19. 204-204DOI: 10.1002/sca.4950190303. ISSN 0161-0457

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div C > Engineering Design
Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:02
Last Modified: 02 Aug 2015 03:30
DOI: 10.1002/sca.4950190303