Caldwell, NHM and Breton, BC and Holburn, DM (1997) FIRST A.I.D.: using remote microscopy and artificial intelligence for SEM fault diagnosis. Scanning: The Journal of Scanning Microscopies, 19. 204-204DOI: 10.1002/sca.4950190303. ISSN 0161-0457
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Additional Information: | SEM: Scanning Electron Microscope |
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Engineering Design |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:37 |
| Last Modified: | 20 Jun 2013 10:16 |
| DOI: | 10.1002/sca.4950190303 |
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