CUED Publications database

Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon

Bilek, MMM and Milne, WI (1997) Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon. Thin Solid Films, 308-30. pp. 79-84. ISSN 0040-6090

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:14
Last Modified: 03 Aug 2015 07:22
DOI: