Bilek, MMM and Milne, WI (1997) Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon. Thin Solid Films, 308-30. pp. 79-84. ISSN 0040-6090
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| Item Type: | Article |
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| Additional Information: | Volume title: The 24th International Conference on Metallurgical Coatings and Thin Films. Edited by Givens, J. H.; Matthews, A.; Mitterer, C.; Rohde, S. L. Unmapped Imported Data : Isbn = 1558993711 |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:42 |
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| Last Modified: | 15 Nov 2011 10:17 |
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| DOI: | |
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