CUED Publications database

Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon

Bilek, MMM and Milne, WI (1997) Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon. Thin Solid Films, 308-30. pp. 79-84. ISSN 0040-6090

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 23:15
Last Modified: 05 Feb 2015 01:34
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