CUED Publications database

Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon

Bilek, MMM and Milne, WI (1997) Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon. Thin Solid Films, 308-30. pp. 79-84. ISSN 0040-6090

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:51
Last Modified: 06 Oct 2014 01:24
DOI: