Bilek, MMM and Milne, WI (1997) Electronic properties and impurity levels in filtered cathodic vacuum arc (FCVA) amorphous silicon. Thin Solid Films, 308-30. pp. 79-84. ISSN 0040-6090
Full text not available from this repository.
|Item Type: ||Article|
|Additional Information: ||Volume title: The 24th International Conference on Metallurgical Coatings and Thin Films. Edited by Givens, J. H.; Matthews, A.; Mitterer, C.; Rohde, S. L. Unmapped Imported Data : Isbn = 1558993711|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:42|
|Last Modified: ||15 Nov 2011 10:17|
Actions (login required)