Yoon, SF and Ji, R and Ahn, J and Milne, WI (1997) A Raman and photoconductivity analysis of boron-doped SiC:H films deposited using the electron cyclotron resonance method. Journal of Materials Science, 32. pp. 1163-1167. ISSN 0022-2461
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|Item Type: ||Article|
|Additional Information: ||Unmapped Imported Data : Isbn = 1558994130|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:42|
|Last Modified: ||11 Mar 2013 01:49|
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