Yoon, SF and Ji, R and Ahn, J and Milne, WI (1997) A Raman and photoconductivity analysis of boron-doped SiC:H films deposited using the electron cyclotron resonance method. Journal of Materials Science, 32. pp. 1163-1167. ISSN 0022-2461
Full text not available from this repository.
| Item Type: | Article |
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| Additional Information: | Unmapped Imported Data : Isbn = 1558994130 |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:42 |
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| Last Modified: | 11 Mar 2013 01:49 |
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| DOI: | |
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