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A Raman and photoconductivity analysis of boron-doped SiC:H films deposited using the electron cyclotron resonance method

Yoon, SF and Ji, R and Ahn, J and Milne, WI (1997) A Raman and photoconductivity analysis of boron-doped SiC:H films deposited using the electron cyclotron resonance method. Journal of Materials Science, 32. pp. 1163-1167. ISSN 0022-2461

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:11
Last Modified: 05 Feb 2015 00:16
DOI: