Yoon, SF and Ji, R and Ahn, J and Milne, WI (1997) A Raman and photoconductivity analysis of boron-doped SiC:H films deposited using the electron cyclotron resonance method. Journal of Materials Science, 32. pp. 1163-1167. ISSN 0022-2461Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Unnamed user with email email@example.com|
|Date Deposited:||18 May 2016 19:09|
|Last Modified:||30 Jul 2016 23:16|