Yoon, SF and Ji, R and Ahn, J and Milne, WI (1996) The effects of process pressure and microwave power on the properties of boron-doped SiC:H films prepared using the ECR-CVD technique. Diamond and Related Materials, 5. pp. 1371-1377. ISSN 0925-9635
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| Item Type: | Article |
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| Additional Information: | Unmapped Imported Data : Isbn = 0780339932 Unmapped Imported Data : Event_dates = 12-13 June 2007 |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:42 |
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| Last Modified: | 20 May 2013 01:42 |
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| DOI: | |
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