Hoole, ACF and Barnes, JR and Murrell, MP and Welland, ME and Broers, AN (1995) Characterization of electron beam induced modification of thermally grown SiO2. Applied Physics Letters, 67. pp. 1538-1540. ISSN 0003-6951Full text not available from this repository.
|Depositing User:||Cron job|
|Date Deposited:||04 Feb 2015 22:40|
|Last Modified:||01 May 2015 18:40|