Hoole, ACF and Barnes, JR and Murrell, MP and Welland, ME and Broers, AN (1995) Characterization of electron beam induced modification of thermally grown SiO2. Applied Physics Letters, 67. pp. 1538-1540. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||15 Dec 2015 12:56|
|Last Modified:||10 Feb 2016 22:44|