Stephenson, AW and Welland, ME (1995) Scanning tunneling microscope crystallography of titanium silicide on Si(100) substrates. Journal of Applied Physics, 77. pp. 563-571. ISSN 0021-8979
Full text not available from this repository.| Item Type: | Article |
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| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:42 |
| Last Modified: | 11 Mar 2013 01:47 |
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