CUED Publications database

Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy

Welland, ME and Murrell, M (1993) Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy. Scanning, 158. pp. 251-256. ISSN 0161-0457

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Item Type: Article
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Date Deposited: 16 Jul 2015 14:54
Last Modified: 31 Jul 2015 21:21
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