Welland, ME and Murrell, M (1993) Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy. Scanning, 158. pp. 251-256. ISSN 0161-0457
Full text not available from this repository.| Item Type: | Article |
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| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:41 |
| Last Modified: | 15 Nov 2011 10:17 |
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