CUED Publications database

Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy

Welland, ME and Murrell, M (1993) Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy. Scanning, 158. pp. 251-256. ISSN 0161-0457

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:51
Last Modified: 17 Mar 2014 14:50
DOI: