CUED Publications database

Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy

Welland, ME and Murrell, M (1993) Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy. Scanning, 158. pp. 251-256. ISSN 0161-0457

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 23:53
Last Modified: 05 Feb 2015 02:15
DOI: