Wong, TMH and Welland, ME (1993) A digital control system for scanning tunnelling microscopy and atomic force microscopy. Measurement Science and Technology, 4. pp. 270-280. ISSN 0957-0233
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:41 |
| Last Modified: | 18 Mar 2013 01:08 |
| DOI: |
Actions (login required)
| View Item |
