CUED Publications database

A digital control system for scanning tunnelling microscopy and atomic force microscopy

Wong, TMH and Welland, ME (1993) A digital control system for scanning tunnelling microscopy and atomic force microscopy. Measurement Science and Technology, 4. pp. 270-280. ISSN 0957-0233

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 09 Dec 2016 17:28
Last Modified: 22 Jun 2017 05:02
DOI: