CUED Publications database

A digital control system for scanning tunnelling microscopy and atomic force microscopy

Wong, TMH and Welland, ME (1993) A digital control system for scanning tunnelling microscopy and atomic force microscopy. Measurement Science and Technology, 4. pp. 270-280. ISSN 0957-0233

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Item Type: Article
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:34
Last Modified: 03 Aug 2015 06:29
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